Application of a DFµA Methodology to facilitate the assembly of a Micro/Nano Measurement Device

A lack of well defined Design for Microassembly (DFμA) methodologies to enable an increased transfer of prototypes from the research lab to production on industrial scale has been identified. The main benefit of such a methodology is the adaptation of the design by matching it with microassembly process characteristics. In addition there needs to be a push in metrology equipment to respond to the ongoing trend of miniaturisation, enabling quality assurance for three dimensional products with nanometer scale features. The presented paper addresses these two gaps by utilising a novel DFμA methodology to enable a state-of-the-art CMM stylus assembly, which is characterised by extremely rigid and challenging requirements. The design of the parts to be assembled is shown. Furthermore the selection of the most suitable assembly equipment is supported. Finally the actual assembly system is described and illustrated as proof of validation.